Wissenschaftsschwerpunkt der

Steffen-Paul
Prof. Steffen Paul

Weitere Informationen:

Studiendekan; ITEM

Ökosystem

Publikationen
2024 // book-chapter

Adaptive Interval Segmentation: An Algorithmic Approach for Optimal SORN Datatypes

Nils Hülsmeier; Moritz Bärthel; Jochen Rust; Steffen Paul

2023 // book-chapter

Fused Three-Input SORN Arithmetic

Moritz Bärthel; Chen Yuxing; Nils Hülsmeier; Jochen Rust; Steffen Paul

2023 // book-chapter

Hybrid SORN Hardware Accelerator for Support Vector Machines

Nils Hülsmeier; Moritz Bärthel; Jochen Rust; Steffen Paul

2022 // book-chapter

On the Implementation of Edge Detection Algorithms with SORN Arithmetic

Moritz Bärthel; Nils Hülsmeier; Jochen Rust; Steffen Paul

Mar 2020 // journal-article

Energy-efficient CMOS delay line with self-supply modulation for low-power SAR ADCs

International Journal of Electronics

Dmitry Osipov; Heiner Lange; Steffen Paul

2016 // journal-article

Two advanced energy-back SAR ADC architectures with 99.21 and 99.37 % reduction in switching energy

Analog Integrated Circuits and Signal Processing

Osipov, D.; Paul, S.
DOI: 10.1007/s10470-016-0707-3

2016 // journal-article

Two-step reset method for energy-efficient SAR ADC switching schemes

Electronics Letters

Osipov, D.; Paul, St.
DOI: 10.1049/el.2016.0890

2016 // conference-paper

Parameter identification for behavioral modeling of analog components including degradation

Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016

Taddiken, M.; Hillebrand, T.; Tscherkaschin, K.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/MIXDES.2016.7529759

2016 // conference-paper

8 Channel neural stimulation ASIC for epidural visual cortex stimulation with on board 90 ppm/°C current reference

Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016

Osipov, D.; Paul, S.
DOI: 10.1109/DDECS.2016.7482455

2016 // conference-paper

Compression and reconstruction methodology for neural signals based on patch ordering inpainting for brain monitoring

ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings

Schmale, S.; Lange, H.; Knoop, B.; Peters-Drolshagen, D.; Paul, S.
DOI: 10.1109/ICASSP.2016.7471797

2016 // conference-paper

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits

Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016

Hillebrand, T.; Hellwege, N.; Taddiken, M.; Tscherkaschin, K.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/MIXDES.2016.7529766

2016 // conference-paper

Charge-based stochastic aging analysis of CMOS circuits

IEEE International Integrated Reliability Workshop Final Report

Hillebrand, T.; Hellwege, N.; Heidmann, N.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/IIRW.2015.7437084

2016 // conference-paper

Hardware-accelerated reconstruction of compressed neural signals based on inpainting

Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016

Schmale, S.; Kesuma, H.; Lange, H.; Rust, J.; Knoop, B.; Peters-Drolshagen, D.; Paul, S.
DOI: 10.1109/MIXDES.2016.7529774

2016 // conference-paper

Bit-Error-Rate measurement of infrared physical channel using reflection via Multi Layer Insulation inside in ARIANE 5 Vehicle Equipment Bay for wireless sensor network communication

IEEE International Conference on Wireless for Space and Extreme Environments, WiSEE 2015

Kesuma, H.; Ahmed, A.; Paul, S.; Sebald, J.
DOI: 10.1109/WiSEE.2015.7393099

2016 // conference-paper

Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process

Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016

Tscherkaschin, K.; Hillebrand, T.; Taddiken, M.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/MIXDES.2016.7529764

2016 // conference-paper

Reliability-aware design method for CMOS circuits

CEUR Workshop Proceedings

Hillebrand, T.; Hellwege, N.; Paul, S.; Peters-Drolshagen, D.
DOI:

2016 // conference-paper

A novel HV-switch scheme with gate-source overvoltage protection for bidirectional neural interfaces

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Osipov, D.; Paul, S.
DOI: 10.1109/ICECS.2015.7440240

2015 // conference-paper

QR-decomposition architecture based on two-variable numeric function approximation

Proceedings -Design, Automation and Test in Europe, DATE

Rust, J.; Ludwig, F.; Paul, S.
DOI:

2015 // conference-paper

Process variability monitor for embedded MEMS inertial sensors exploiting digital calibration coefficients

Procedia Engineering

Hellwege, N.; Heinssen, S.; Niederkleine, K.; Heidmann, N.; Paul, S.T.; Peters-Drolshagen, D.
DOI: 10.1016/j.proeng.2015.08.662

2015 // conference-paper

A new current stimulator architecture for visual cortex stimulation

2015 Nordic Circuits and Systems Conference, NORCAS 2015: NORCHIP and International Symposium on System-on-Chip, SoC 2015

Osipov, D.; Paul, S.; Strokov, S.; Kreiter, A.K.
DOI: 10.1109/NORCHIP.2015.7364399

2015 // conference-paper

ADC topology based on compressed sensing for low power brain monitoring

Procedia Engineering

Lange, H.; Schmale, S.; Knoop, B.; Peters-Drolshagen, D.; Paul, S.
DOI: 10.1016/j.proeng.2015.08.624

2015 // conference-paper

Design method for multiplier-less two-variable numeric function approximation

Proceedings -Design, Automation and Test in Europe, DATE

Rust, J.; Paul, S.
DOI:

2015 // conference-paper

Optimum operating points of transistors with minimal aging-Aware sensitivity

Proceedings, SBCCI 2015 - 28th Symposium on Integrated Circuits and Systems Design: Chip in Bahia

Hellwege, N.; Heidmann, N.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1145/2800986.2801021

2015 // conference-paper

NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits

IEEE International Reliability Physics Symposium Proceedings

Heidmann, N.; Hellwege, N.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/IRPS.2015.7112779

2015 // conference-paper

Variability-aware aging modeling for reliability analysis of an analog neural measurement system

Proceedings - 2015 20th IEEE European Test Symposium, ETS 2014

Heidmann, N.; Hellwege, N.; Paul, S.; Peters-Drolshagen, D.
DOI: 10.1109/ETS.2015.7138753